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 Freescale Semiconductor Technical Data
MC145170-2/D Rev. 5, 1/2005
MC145170-2
MC145170-2
PLL Frequency Synthesizer with Serial Interface
SCALE 2:1
Package Information P Suffix SOG Package Case 648
Package Information D Suffix Plastic DIP Package Case 751B
Package Information DT Suffix TSSOP Package Case 948C
1
Introduction
Device MC145170P2 MC145170D2
Ordering Information Operating Temperature Range Package Plastic DIP TA = -40 to 85C SOG-16 TSSOP-16
The new MC145170-2 is pin-for-pin compatible with the MC145170-1. A comparison of the two parts is shown in Table 1 on page 2. The MC145170-2 is recommended for new designs and has a more robust power-on reset (POR) circuit that is more responsive to momentary power supply interruptions. The two devices are actually the same chip with mask options for the POR circuit. The more robust POR circuit draws approximately 20 A additional supply current. Note that the maximum specification of 100 A quiescent supply current has not changed. The MC145170-2 is a single-chip synthesizer capable of direct usage in the MF, HF, and VHF bands. A special architecture makes this PLL easy to program. Either a bit- or byte-oriented format may be used. Due to the patented BitGrabberTM registers, no address/steering bits are required for random access of the three registers. Thus, tuning can be accomplished via a 2-byte serial transfer to the 16-bit N register.
MC145170DT2
Contents
1 2 3 4 5 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Electrical Characteristics . . . . . . . . . . . . . . . 3 Pin Connections . . . . . . . . . . . . . . . . . . . . . . . 9 Design Considerations . . . . . . . . . . . . . . . . 18 Packaging . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Freescale reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. (c) Freescale Semiconductor, Inc., 2005. All rights reserved.
Introduction
The device features fully programmable R and N counters, an amplifier at the fin pin, on-chip support of an external crystal, a programmable reference output, and both single- and double-ended phase detectors with linear transfer functions (no dead zones). A configuration (C) register allows the part to be configured to meet various applications. A patented feature allows the C register to shut off unused outputs, thereby minimizing noise and interference. In order to reduce lock times and prevent erroneous data from being loaded into the counters, a patented jam-load feature is included. Whenever a new divide ratio is loaded into the N register, both the N and R counters are jam-loaded with their respective values and begin counting down together. The phase detectors are also initialized during the jam load. * Operating Voltage Range: 2.7 to 5.5 V * Maximum Operating Frequency: 185 MHz @ Vin = 500 mVpp, 4.5 V Minimum Supply 100 MHz @ Vin = 500 mVpp, 3.0 V Minimum Supply * Operating Supply Current: 0.6 mA @ 3.0 V, 30 MHz 1.5 mA @ 3.0 V, 100 MHz 3.0 mA @ 5.0 V, 50 MHz 5.8 mA @ 5.0 V, 185 MHz * Operating Temperature Range: -40 to 85C * R Counter Division Range: 1 and 5 to 32,767 * N Counter Division Range: 40 to 65,535 * Programs through Standard Serial Peripheral Interface (SPI) * See Application Notes AN1207/D and AN1671/D * Contact Freescale for MC145170 control software.
Table 1. Comparision of the PLL Frequency Synthesizers
Parameter Minimum Supply Voltage Maximum Input Current, fin Dynamic Characteristics, fin (Figure 26) Power-On Reset Circuit MC145170-2 2.7 V 150 A Unchanged Improved MC145170-1 2.5 V 120 A -
MC145170-2 Technical Data, Rev. 5 2 Freescale Semiconductor
Electrical Characteristics
OSCin OSCout
1 2 OSC 15-stage R Counter fR Control
9
fR
15 REFout 3 4-Stage Reference Divider 3 BitGrabber R Register 15 Bits Lock Detector and Control
11
LD
CLK Din Dout
7 5 Shift Register And Control Logic BitGrabber C Register 8 Bits Phase/Frequency Detector A and Control 13 PDout
16
8
POR ENB 6 BitGrabber N Register 16 Bits 16 fV Control fin 4 Input AMP 16-Stage N Counter Pin 16 = VDD Pin 12 = VSS Phase/Frequency Detector B and Control 14 15 fR fV
10
fV
This device contains 4,800 active transistors.
Figure 1. Block Diagram
2
Electrical Characteristics
Table 2. Maximum Ratings (Voltages Referenced to VSS)
Parameter DC Supply Voltage DC Input Voltage DC Output Voltage DC Input Current, per Pin DC Output Current, per Pin DC Supply Current, VDD and VSS Pins Power Dissipation, per Package Storage Temperature Lead Temperature, 1 mm from Case for 10 seconds Symbol VDD Vin Vout Iin Iout IDD PD Tstg TL Value -0.5 to 5.5 -0.5 to VDD + 0.5 -0.5 to VDD + 0.5 10 20 30 300 -65 to 150 260 Unit V V V mA mA mA mW C C
Note: Maximum Ratings and ESD 1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the limits in the Electrical Characteristics tables or Pin Descriptions section. 2. ESD data available upon request.
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 3
Electrical Characteristics
Table 3. Electrical Characteristics (Voltages Referenced to VSS, TA = -40 to 85C)
Parameter Power Supply Voltage Range Maximum Low-Level Input Voltage (Din, CLK, ENB, fin)
1
Test Condition
Symbol VDD
VDD V 2.7 4.5 5.5 2.7 4.5 5.5 2.7 5.5 2.7 5.5 2.7 5.5 2.7 4.5 5.5 2.7 4.5 5.5 4.5 4.5 5.5 5.5
Guaranteed Unit Limit 2.7 to 5.5 0.54 1.35 1.65 2.16 3.15 3.85 0.15 0.20 0.1 0.1 2.6 5.4 0.12 0.36 0.36 -0.12 -0.36 -0.36 1.6 -1.6 1.0 150 V V
dc Coupling to fin
VIL
Minimum High-Level Input Voltage1 (Din, CLK, ENB, fin) Minimum Hysteresis Voltage (CLK, ENB) Maximum Low-Level Output Voltage (Any Output) Minimum High-Level Output Voltage (Any Output) Minimum Low-Level Output Current (PDout, REFout, fR, fV, LD, R, V) Minimum High-Level Output Current (PDout, REFout, fR, fV, LD, R, V) Minimum Low-Level Output Current (Dout) Minimum High-Level Output Current (Dout) Maximum Input Leakage Current (Din, CLK, ENB, OSCin) Maximum Input Current (fin) Maximum Output Leakage Current (PDout) (Dout) Maximum Quiescent Supply Current
dc Coupling to fin
VIH
V
VHys Iout = 20 A Iout = - 20 A Vout = 0.3 V Vout = 0.4 V Vout = 0.5 V Vout = 2.4 V Vout = 4.1 V Vout = 5.0 V Vout = 0.4 V Vout = 4.1 V Vin = VDD or VSS Vin = VDD or VSS Vin = VDD or VSS, Output in High-Impedance State VOL VOH IOL
V V V mA
IOH
mA
IOL IOH Iin Iin IOZ
mA mA A A
5.5 5.5 Vin = VDD or VSS; Outputs Open; Excluding fin Amp Input Current Component fin = 500 mVpp; OSCin = 1.0 MHz @ 1.0 Vpp; LD, fR, fV, REFout = Inactive and No Connect; OSCout, V, R, PDout = No Connect; Din, ENB, CLK = VDD or VSS IDD 5.5
100 5.0 100
nA A A
Maximum Operating Supply Current
Idd
-
[Note 2]
mA
Note: 1. When dc coupling to the OSCin pin is used, the pin must be driven rail-to-rail. In this case, OSCout should be floated. 2. The nominal values at 3.0 V are 0.6 mA @ 30 MHz, and 1.5 mA @ 100 MHz. The nominal values at 5.0 V are 3.0 mA @ 50 MHz, and 5.8 mA @ 185 MHz. These are not guaranteed limits.
MC145170-2 Technical Data, Rev. 5 4 Freescale Semiconductor
Electrical Characteristics
Table 4. AC Interface Characteristics ( TA = -40 to 85C, CL = 50 pF, Input tr = tf = 10 ns, unless otherwise noted.)
Parameter Serial Data Clock Frequency (Note: Refer to Clock tw Below) Symbol fclk Figure No. 2 VDD V 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 Guaranteed Limit dc to 3.0 dc to 4.0 dc to 4.0 150 85 85 300 200 200 0 to 200 0 to 100 0 to 100 150 50 50 900 150 150 10 10 Unit MHz
Maximum Propagation Delay, CLK to Dout
tPLH, tPHL
2, 6
ns
Maximum Disable Time, Dout Active to High Impedance
tPLZ, tPHZ
3, 7
ns
Access Time, Dout High Impedance to Active
tPZL, tPZH
3, 7
ns
Maximum Output Transition Time, Dout CL = 50 pF CL = 200 pF
tTLH, tTHL
2, 6
ns
2, 6
ns
Maximum Input Capacitance - Din, ENB, CLK Maximum Output Capacitance - Dout
Cin Cout
pF pF
Table 5. Timing Requirements (TA = -40 to 85C, Input tr = tf = 10 ns, unless otherwise noted.)
Parameter Minimum Setup and Hold Times, Din vs CLK Symbol tsu, th Figure No. 4 VDD V 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 Guaranteed Limit 55 40 40 135 100 100 400 300 300 166 125 125 100 100 100 Unit ns
Minimum Setup, Hold, and Recovery Times, ENB vs CLK
tsu, th, trec
5
ns
Minimum Inactive-High Pulse Width, ENB
tw(H)
5
ns
Minimum Pulse Width, CLK
tw
2
ns
Maximum Input Rise and Fall Times, CLK
tr, tf
2
s
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 5
Electrical Characteristics
2.1
Switching Waveforms
tf 90% CLK 50% 10% tw 1/fclk tPLH Dout 90% 50% 10% tTLH tTHL tPHL tw tr VDD VSS
VDD ENB 50% tPZL Dout 50% tPZH Dout 50% tPHZ 90% tPLZ 10% VSS High Impedance VDD VSS High Impedance
Figure 2.
Figure 3.
Valid Din 50% tsu CLK th 50% VDD VSS VDD VSS
tw(H) ENB 50% tsu CLK 50% First CLK Last CLK th
VDD VSS trec VDD VSS
Figure 4.
Figure 5.
Test Point Device Under Test
Test Point 7.5 k Device Under Test
CL*
CL*
Connect to VDD when testing tPLZ AND tPZL. Connect to VSS when testing tPHZ and tPZH.
* Includes all probe and fixture capacitance.
*Includes all probe and fixture capacitance.
Figure 6. Test Circuit
Figure 7. Test Circuit
MC145170-2 Technical Data, Rev. 5 6 Freescale Semiconductor
Electrical Characteristics
Table 6. Loop Specifications (TA = -40 to 85C)
Parameter Test Condition Vin 500 mVpp Sine Wave, N Counter Set to Divide Ratio Such that fV 2.0 MHz Vin 1.0 Vpp Sine Wave, OSCout = No Connect, R Counter Set to Divide Ratio Such that fR 2 MHz C1 30 pF C2 30 pF Includes Stray Capacitance CL = 30 pF Symbol Figure No. 8 VDD V 2.7 3.0 4.5 5.5 2.7 3.0 4.5 5.5 2.7 3.0 4.5 5.5 2.7 4.5 5.5 2.7 4.5 5.5 13, 14 2.7 4.5 5.5 2.7 4.5 5.5 Guaranteed Range Unit Min 5.0 5.0 25 45 1.0* 1.0* 1.0* 1.0* 2.0 2.0 2.0 2.0 dc dc dc dc dc dc 20 16 Max 80 100 185 185 22 25 30 35 12 12 15 15 10 10 2.0 2.0 100 90 65 60 7.0 7.0 MHz
Input Frequency, fin [Note]
f
Input Frequency, OSCin Externally Driven with ac-coupled Signal Crystal Frequency, OSCin and OSCout
f
9
MHz
fXTAL
11
MHz
Output Frequency, REFout
fout
12, 14
MHz
Operating Frequency of the Phase Detectors Output Pulse Width, R, V, fR in Phase with fV and LD CL = 50 pF Output Transition Times, R, V, LD, fR, and fV Input Capacitance fin OSCin CL = 50 pF
f
MHz
tw
ns
tTLH, tTHL Cin
13, 14
ns
-
pF
* If lower frequency is desired, use wave shaping or higher amplitude sinusoidal signal in ac-coupled case. Also, see Figure 25 on page 22 for dc coupling.
Sine Wave Generator
100 pF fin Vin 50 * VSS VDD V+ fV Test Point
MC145170-2
*Characteristic impedance
Figure 8. Test Circuit, fin
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 7
Electrical Characteristics
V+
Sine Wave Generator 0.01 F OSCin 5.0 M Vin MC145170-2 OSCout VSS VDD V+ fR Test Point
1.0 M Sine Wave Generator 0.01 F OSCin 1.0 M fR Test Point
50
50
Vin
MC145170-2 OSCout VSS VDD
No Connect
V+
Figure 9. Test Circuit, OSC Circuitry Externally Driven [Note]
Figure 10. Circuit to Eliminate Self-Oscillation, OSC Circuitry Externally Driven [Note]
NOTE Use the circuit of Figure 10 to eliminate self-oscillation of the OSCin pin when the MC145170-2 has power applied with no external signal applied at Vin. (Self-oscillation is not harmful to the MC145170-2 and does not damage the IC.)
OSCin MC145170-2 REFout C2 OSCout VSS VDD Test Point
C1
1/f REFout REFout 50%
V+
Figure 11. Test Circuit, OSC Circuit with Crystal
Figure 12. Test Circuit
Test Point
tw Output 50% 90% 10% tTHL
Output Device Under Test CL*
tTLH
*Includes all probe and fixture capacitance.
Figure 13. Switching Waveform
Figure 14. Test Load Circuit
MC145170-2 Technical Data, Rev. 5 8 Freescale Semiconductor
Pin Connections
3
3.1
Pin Connections
Digital Interface Pins
Din Serial Data Input (Pin 5) The bit stream begins with the most significant bit (MSB) and is shifted in on the low-to-high transition of CLK. The bit pattern is 1 byte (8 bits) long to access the C or configuration register, 2 bytes (16 bits) to access the N register, or 3 bytes (24 bits) to access the R register. Additionally, the R register can be accessed with a 15-bit transfer (see Table 7). An optional pattern which resets the device is shown in Figure 15. The values in the C, N, and R registers do not change during shifting because the transfer of data to the registers is controlled by ENB. The bit stream needs neither address nor steering bits due to the innovative BitGrabber registers. Therefore, all bits in the stream are available to be data for the three registers. Random access of any register is provided (i.e., the registers may be accessed in any sequence). Data is retained in the registers over a supply range of 2.7 to 5.5 V. The formats are shown in Figures 15, 16, 17, and 18. Din typically switches near 50% of VDD to maximize noise immunity. This input can be directly interfaced to CMOS devices with outputs guaranteed to switch near rail-to-rail. When interfacing to NMOS or TTL devices, either a level shifter (MC74HC14A, MC14504B) or pull-up resistor of 1 to 10 k must be used. Parameters to consider when sizing the resistor are worst-case IOL of the driving device, maximum tolerable power consumption, and maximum data rate.
Table 7. Register Access (MSBs are shifted in first, C0, N0, and R0 are the LSBs)
Number of Clocks 9 to 13 8 16 15 or 24 Other Values 32 Values > 32 Accessed Register See Figure 15 C Register N Register R Register None See Figures 27 to 34 Bit Nomenclature (Reset) C7, C6, C5, . . ., C0 N15, N14, N13, . . ., N0 R14, R13, R12, . . ., R0
CLK Serial Data Clock Input (Pin 7) Low-to-high transitions on Clock shift bits available at Din, while high-to-low transitions shift bits from Dout. The chip's 16-1/2-stage shift register is static, allowing clock rates down to dc in a continuous or intermittent mode. Four to eight clock cycles followed by five clock cycles are needed to reset the device; this is optional. Eight clock cycles are required to access the C register. Sixteen clock cycles are needed for the N register. Either 15 or 24 cycles can be used to access the R register (see Table 7 and Figures 15, 16, 17, and 18). For cascaded devices, see Figures 27 to 34.
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 9
Pin Connections
CLK typically switches near 50% of VDD and has a Schmitt-triggered input buffer. Slow CLK rise and fall times are allowed. See the last paragraph of Din for more information. NOTE To guarantee proper operation of the power-on reset (POR) circuit, the CLK pin must be held at the potential of either the VSS or VDD pin during power up. That is, the CLK input should not be floated or toggled while the VDD pin is ramping from 0 to at least 2.7 V. If control of the CLK pin is not practical during power up, the initialization sequence shown in Figure 15 must be used. ENB Active-Low Enable Input (Pin 6) This pin is used to activate the serial interface to allow the transfer of data to/from the device. When ENB is in an inactive high state, shifting is inhibited, Dout is forced to the high-impedance state, and the port is held in the initialized state. To transfer data to the device, ENB (which must start inactive high) is taken low, a serial transfer is made via Din and CLK, and ENB is taken back high. The low-to-high transition on ENB transfers data to the C, N, or R register depending on the data stream length per Table 7. NOTE Transitions on ENB must not be attempted while CLK is high. This puts the device out of synchronization with the microcontroller. Resynchronization occurs when ENB is high and CLK is low. This input is also Schmitt-triggered and switches near 50% of VDD, thereby minimizing the chance of loading erroneous data into the registers. See the last paragraph of Din for more information. Dout Three-State Serial Data Output (Pin 8) Data is transferred out of the 16-1/2-stage shift register through Dout on the high-to-low transition of CLK. This output is a No Connect, unless used in one of the manners discussed below. Dout could be fed back to an MCU/MPU to perform a wrap-around test of serial data. This could be part of a system check conducted at power up to test the integrity of the system's processor, PC board traces, solder joints, etc. The pin could be monitored at an in-line QA test during board manufacturing. Finally, Dout facilitates troubleshooting a system and permits cascading devices.
3.2
Reference Pins
OSCin /OSCout Reference Oscillator Input/Output (Pins 1, 2) These pins form a reference oscillator when connected to terminals of an external parallel-resonant crystal. Frequency-setting capacitors of appropriate values as recommended by the crystal supplier are connected
MC145170-2 Technical Data, Rev. 5 10 Freescale Semiconductor
Pin Connections
from each pin to ground (up to a maximum of 30 pF each, including stray capacitance). An external feedback resistor of 1.0 to 5.0 M is connected directly across the pins to ensure linear operation of the amplifier. The required connections for the components are shown in Figure 11. 5 M is required across the OSCin and OSCout pins in the ac-coupled case (see Figure 9 or alternate circuit Figure 10). OSCout is an internal node on the device and should not be used to drive any loads (i.e., OSCout is unbuffered). However, the buffered REFout is available to drive external loads. The external signal level must be at least 1 Vpp; the maximum frequencies are given in Table 6, the Loop Specifications table on page 7. These maximum frequencies apply for R Counter divide ratios as indicated in the table. For very small ratios, the maximum frequency is limited to the divide ratio times 2 MHz. (Reason: the phase/frequency detectors are limited to a maximum input frequency of 2 MHz.) If an external source is available which swings virtually rail-to-rail (VDD to VSS), then dc coupling can be used. In the dc-coupled case, no external feedback resistor is needed. OSCout must be a No Connect to avoid loading an internal node on the device, as noted above. For frequencies below 1 MHz, dc coupling must be used. The R counter is a static counter and may be operated down to dc. However, wave shaping by a CMOS buffer may be required to ensure fast rise and fall times into the OSCin pin. See Figure 25. Each rising edge on the OSCin pin causes the R counter to decrement by one. REFout Reference Frequency Output (Pin 3) This output is the buffered output of the crystal-generated reference frequency or externally provided reference source. This output may be enabled, disabled, or scaled via bits in the C register (see Figure 16). REFout can be used to drive a microprocessor clock input, thereby saving a crystal. Upon power up, the on-chip power-on-initialize circuit forces REFout to the OSCin divided-by-8 mode. REFout is capable of operation to 10 MHz; see the Loop Specifications table. Therefore, divide values for the reference divider are restricted to two or higher for OSCin frequencies above 10 MHz. If unused, the pin should be floated and should be disabled via the C register to minimize dynamic power consumption and electromagnetic interference (EMI).
3.3
Counter Output Pins
fR R Counter Output (Pin 9) This signal is the buffered output of the 15-stage R counter. fR can be enabled or disabled via the C register (patented). The output is disabled (static low logic level) upon power up. If unused, the output should be left disabled and unconnected to minimize interference with external circuitry. The fR signal can be used to verify the R counter's divide ratio. This ratio extends from 5 to 32,767 and is determined by the binary value loaded into the R register. Also, direct access to the phase detector via the OSCin pin is allowed by choosing a divide value of 1 (see Figure 17). The maximum frequency which the phase detectors operate is 2 MHz. Therefore, the frequency of fR must not exceed 2 MHz.
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 11
Pin Connections
When activated, the fR signal appears as normally low and pulses high. The pulse width is 4.5 cycles of the OSCin pin signal, except when a divide ratio of 1 is selected. When 1 is selected, the OSCin signal is buffered and appears at the fR pin. fV N Counter Output (Pin 10) This signal is the buffered output of the 16-stage N counter. fV can be enabled or disabled via the C register (patented). The output is disabled (static low logic level) upon power up. If unused, the output should be left disabled and unconnected to minimize interference with external circuitry. The fV signal can be used to verify the N counter's divide ratio. This ratio extends from 40 to 65,535 and is determined by the binary value loaded into the N register. The maximum frequency which the phase detectors operate is 2 MHz. Therefore, the frequency of fV must not exceed 2 MHz. When activated, the fV signal appears as normally low and pulses high.
3.4
Loop Pins
fin Frequency Input (Pin 4) This pin is a frequency input from the VCO. This pin feeds the on-chip amplifier which drives the N counter. This signal is normally sourced from an external voltage-controlled oscillator (VCO), and is ac-coupled into fin. A 100 pF coupling capacitor is used for measurement purposes and is the minimum size recommended for applications (see Figure 25). The frequency capability of this input is dependent on the supply voltage as listed in Table 6, Loop Specifications. For small divide ratios, the maximum frequency is limited to the divide ratio times 2 MHz. (Reason: the phase/frequency detectors are limited to a maximum frequency of 2 MHz.) For signals which swing from at least the VIL to VIH levels listed in Table 3, the Electrical Characteristics table on page 4, dc coupling may be used. Also, for low frequency signals (less than the minimum frequencies shown in Table 6 on page 7), dc coupling is a requirement. The N counter is a static counter and may be operated down to dc. However, wave shaping by a CMOS buffer may be required to ensure fast rise and fall times into the fin pin. See Figure 25. Each rising edge on the fin pin causes the N counter to decrement by 1. PDout Single-Ended Phase/Frequency Detector Output (Pin 13) This is a three-state output for use as a loop error signal when combined with an external low-pass filter. Through use of a patented technique, the detector's dead zone has been eliminated. Therefore, the phase/frequency detector is characterized by a linear transfer function. The operation of the phase/frequency detector is described below and is shown in Figure 19. POL bit (C7) in the C register = low (see Figure 16) Frequency of fV > fR or Phase of fV Leading fR: negative pulses from high impedance
MC145170-2 Technical Data, Rev. 5 12 Freescale Semiconductor
Pin Connections
Frequency of fV < fR or Phase of fV Lagging fR: positive pulses from high impedance Frequency and Phase of fV = fR: essentially high-impedance state; voltage at pin determined by loop filter POL bit (C7) = high Frequency of fV > fR or Phase of fV Leading fR: positive pulses from high impedance Frequency of fV < fR or Phase of fV Lagging fR: negative pulses from high impedance Frequency and Phase of fV = fR: essentially high-impedance state; voltage at pin determined by loop filter This output can be enabled, disabled, and inverted via the C register. If desired, PDout can be forced to the high-impedance state by utilization of the disable feature in the C register (patented). R and V Double-Ended Phase/Frequency Detector Outputs (Pins 14, 15) These outputs can be combined externally to generate a loop error signal. Through use of a patented technique, the detector's dead zone has been eliminated. Therefore, the phase/frequency detector is characterized by a linear transfer function. The operation of the phase/frequency detector is described below and is shown in Figure 19. POL bit (C7) in the C register = low (see Figure 16) Frequency of fV > fR or Phase of fV Leading fR: V = negative pulses, R = essentially high Frequency of fV < fR or Phase of fV Lagging fR: V = essentially high, R = negative pulses Frequency and Phase of fV = fR: V and R remain essentially high, except for a small minimum time period when both pulse low in phase POL bit (C7) = high Frequency of fV > fR or Phase of fV Leading fR: R = negative pulses, V = essentially high Frequency of fV < fR or Phase of fV Lagging fR: R = essentially high, V = negative pulses Frequency and Phase of fV = fR: V and R remain essentially high, except for a small minimum time period when both pulse low in phase These outputs can be enabled, disabled, and interchanged via the C register (patented). LD Lock Detector Output (Pin 11) This output is essentially at a high level with narrow low-going pulses when the loop is locked (fR and fV of the same phase and frequency). The output pulses low when fV and fR are out of phase or different frequencies (see Figure 19). This output can be enabled and disabled via the C register (patented). Upon power up, on-chip initialization circuitry disables LD to a static low logic level to prevent a false "lock" signal. If unused, LD should be disabled and left open.
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 13
Pin Connections
3.5
Power Supply
VDD Most Positive Supply Potential (Pin 16) This pin may range from 2.7 to 5.5 V with respect to VSS. For optimum performance, VDD should be bypassed to VSS using low-inductance capacitor(s) mounted very close to the device. Lead lengths on the capacitor(s) should be minimized. (The very fast switching speed of the device causes current spikes on the power leads.) VSS Most Negative Supply Potential (Pin 12) This pin is usually ground. For measurement purposes, the VSS pin is tied to a ground plane.
Power Up
ENB
CLK
1
2
3
1
2
3
4
5
4 or More Clocks Din Don't Cares Zeroes One Zero Don't Cares
Figure 15. Reset Sequence
NOTES: This initialization sequence is usually not necessary because the on-chip power-on reset circuit performs the initialization function. However, this initialization sequence must be used immediately after power up if control of the CLK pin is not possible. That is, if CLK (Pin 7) toggles or floats upon power up, use the above sequence to reset the device. Also, use this sequence if power is momentarily interrupted such that the supply voltage to the device is reduced to below 2.7 V, but not down to at least 1 V (for example, the supply drops down to 2 V). This is necessary because the on-chip power-on reset is only activated when the supply ramps up from a voltage below approximately 1.0 V.
MC145170-2 Technical Data, Rev. 5 14 Freescale Semiconductor
Pin Connections
ENB
CLK
1 MSB
2
3
4
5
6
7 LSB
8
*
Din
C7
C6
C5
C4
C3
C2
C1
C0
* At this point, the new byte is transferred to the C register and stored. No other registers are affected.
C7 - POL:
Select the output polarity of the phase/frequency detectors. When set high, this bit inverts PDout and interchanges the R function with V as depicted in Figure 19. Also see the phase detector output pin descriptions for more information. This bit is cleared low at power up.
C6 - PDA/B: Selects which phase/frequency detector is to be used. When set high, enables the output of phase/frequency detector A (PDout) and disables phase/frequency detector B by forcing R and V to the static high state. When cleared low, phase/frequency detector B is enabled (R and V) and phase/frequency detector A is disabled with PDout forced to the high-impedance state. This bit is cleared low at power up. C5 - LDE: Enables the lock detector output when set high. When the bit is cleared low, the LD output is forced to a static low level. This bit is cleared low at power up.
C4 - C2, OSC2 - OSC0: Reference output controls which determines the REFout characteristics as shown below. Upon power up, the bits are initialized such that OSCin/8 is selected.
C4 0 0 0 0 1 1 1 1 C3 0 0 1 1 0 0 1 1 C2 0 1 0 1 0 1 0 1 REFout Frequency dc (Static Low) OSCin OSCin /2 OSCin /4 OSCin /8 (POR Default) OSCin /16 OSCin /8 OSCin /16
C1 - fVE: C0 - fRE:
Enables the fV output when set high. When cleared low, the fV output is forced to a static low level. The bit is cleared low upon power up. Enables the fR output when set high. When cleared low, the fR output is forced to a static low level. The bit is cleared low upon power up.
Figure 16. C Register Access and Format (8 Clock Cycles are Used)
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 15
Pin Connections
/ / /
Figure 17. R Register Access and Formats (Either 24 or 15 Clock Cycles Can Be Used)
MC145170-2 Technical Data, Rev. 5 16 Freescale Semiconductor
/ /
/
Pin Connections
ENB
CLK
1 MSB
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16 LSB
*
Din
N15
N14
N13
N12
N11
N10
N9
N8
N7
N6
N5
N4
N3
N2
N1
N0
0 0 0 0 . . . 0 0 0 0 0 0 0 . . . F F
0 0 0 0 . . . 0 0 0 0 0 0 0 . . . F F
0 0 0 0 . . . 2 2 2 2 2 2 2 . . . F F
0 1 2 3 . . . 5 6 7 8 9 A B . . . E F
Not Allowed Not Allowed Not Allowed Not Allowed Not Allowed Not Allowed Not Allowed N Counter = /40 N Counter = /41 N Counter = /42 N Counter = /43 N Counter = /65,534 N Counter = /65,535 Decimal Equivalent
Hexadecimal Value
* At this point, the two new bytes are transferred to the N register and stored. No other registers are affected. In addition, the N and R counters are jam-loaded and begin counting down together.
Figure 18. N Register Access and Format (16 Clock Cycles Are Used)
fR Reference OSCin / R fV Feedback (fin / N PDout *
VH VL VH VL VH High Impedance VL VH VL VH VL VH VL
R V
LD
VH = High voltage level VL = Low voltage level *At this point, when both fR and fV are in phase, both the sinking and sourcing output FETs are turned on for a very short internal. Note: The PDout generates error pulses during out-of-lock conditions. When locked in phase and frequency, the output is high impedance and the voltage at that pin is determined by the low-pass filter capacitor. PDout, R and V are shown with the polarity bit (POL) = low; see Figure 16 for POL.
Figure 19. Phase/Frequency Detector and Lock Detector Output Waveforms
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 17
Design Considerations
4
4.1
Design Considerations
Crystal Oscillator Considerations
The following options may be considered to provide a reference frequency to our CMOS frequency synthesizers.
4.1.1
Use of a Hybrid Crystal Oscillator
Commercially available temperature-compensated crystal oscillators (TCXOs) or crystal-controlled data clock oscillators provide very stable reference frequencies. An oscillator capable of CMOS logic levels at the output may be direct or dc coupled to OSCin. If the oscillator does not have CMOS logic levels on the outputs, capacitive or ac coupling to OSCin may be used (see Figures 9 and 10). For additional information about TCXOs, visit www.freescale.com on the world wide web.
4.1.2
Use of the On-Chip Oscillator Circuitry
The on-chip amplifier (a digital inverter) along with an appropriate crystal may be used to provide a reference source frequency. A fundamental mode crystal, parallel resonant at the desired operating frequency, should be connected as shown in Figure 20. The crystal should be specified for a loading capacitance (CL) which does not exceed 20 pF when used at the highest operating frequencies listed in Table 6, Loop Specifications. Larger CL values are possible for lower frequencies. Assuming R1 = 0 , the shunt load capacitance (CL) presented across the crystal can be estimated to be: C in C out C1 x C2 C L = --------------------------- + C a + C stray + -------------------C in + C out C1 + C2 where Cin = 5.0 pF (see Figure 21) Cout = 6.0 pF (see Figure 21) Ca = 1.0 pF (see Figure 21) C1 and C2 = external capacitors (see Figure 21) Cstray = the total equivalent external circuit stray capacitance appearing across the crystal terminals The oscillator can be "trimmed" on-frequency by making a portion or all of C1 variable. The crystal and associated components must be located as close as possible to the OSCin and OSCout pins to minimize distortion, stray capacitance, stray inductance, and startup stabilization time. Circuit stray capacitance can also be handled by adding the appropriate stray value to the values for Cin and Cout. For this approach, the term Cstray becomes 0 in the above expression for CL. A good design practice is to pick a small value for C1, such as 5 to 10 pF. Next, C2 is calculated. C1 < C2 results in a more robust circuit for start-up and is more tolerant of crystal parameter variations.
MC145170-2 Technical Data, Rev. 5 18 Freescale Semiconductor
Design Considerations
Power is dissipated in the effective series resistance of the crystal, Re, in Figure 22. The maximum drive level specified by the crystal manufacturer represents the maximum stress that the crystal can withstand without damage or excessive shift in operating frequency. R1 in Figure 20 limits the drive level. The use of R1 is not necessary in most cases. To verify that the maximum dc supply voltage does not cause the crystal to be overdriven, monitor the output frequency at the REFout pin (OSCout is not used because loading impacts the oscillator). The frequency should increase very slightly as the dc supply voltage is increased. An overdriven crystal decreases in frequency or becomes unstable with an increase in supply voltage. The operating supply voltage must be reduced or R1 must be increased in value if the overdriven condition exists. The user should note that the oscillator start-up time is proportional to the value of R1. Through the process of supplying crystals for use with CMOS inverters, many crystal manufacturers have developed expertise in CMOS oscillator design with crystals. Discussions with such manufacturers can prove very helpful.
Frequency Synthesizer
OSCin
Rf R1*
OSCout
C1 5.0 to 10 pF
C2
* May be needed in certain cases. See text.
Figure 20. Pierce Crystal Oscillator Circuit
Ca Cin Cstray Cout
OSCin
OSCout
Figure 21. Parasitic Capacitances of the Amplifier and Cstray
LS CS 2
RS 1 2 1
CO 1 Re Xe 2
NOTE: Values are supplied by crystal manufacturer (parallel resonant crystal).
Figure 22. Equivalent Crystal Networks
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 19
Design Considerations (A)
K K VCO ------------------------NR 1 C N n = ---------------------------2K K VCO n = 1 F ( s ) = ------------------------R 1 sC + 1
PDout
R1 C
VCO
(B)
PDout
R1 R2 C
VCO
n =
K K VCO ----------------------------------NC ( R 1 + R 2 )
N = 0.5 n R 2 C + ------------------------- K K VCO R 2 sC + 1 F ( s ) = -------------------------------------------( R 1 + R 2 )sC + 1
(C)
R1 R1 R2 C
R2
R V
n =
C VCO
K K VCO ------------------------NCR 1
+
A MC33077 or equivalent (Note 3)
n R2 C = -------------------2 R 2 sC + 1 F ( s ) = ------------------------R 1 sC
NOTES: 1. For (C), R1 is frequently split into two series resistors; each resistor is equal to R1 divided by 2. A capacitor CC is then placed from the midpoint to ground to further filter the error pulses. The value of CC should be such that the corner frequency of this network does not significantly affect n. 2. The R and V outputs swing rail-to-rail. Therefore, the user should be careful not to exceed the common mode input range of the op amp.
Denifitions: N = Total Division Ratio in Feedback Loop K (Phase Detector Gain) = VDD/4p volts per radian for PDout K (Phase Detector Gain) - VDD/2p volts per radian for fV and fR For a nominal design starting point, the user might consider a damping factor = 0.7 and a natural loop frequency n = (2fR/50) where fR is the frequency at the phase detector input. Larger n values result in faster loop lock times and, for similar sideband filtering, higher fR-related VCO standards.
2f VCO K VCO ( VCO Gain ) = -------------------------V VCO
Figure 23. Phase-Locked Loop - Low Pass Filter Design
MC145170-2 Technical Data, Rev. 5 20 Freescale Semiconductor
Design Considerations
Buffer VHF VCO
VHF Output
Low-pass Filter V+ 1 OSC in 2 OSC out 4 5 6
MC145170-2
VDD 16 V 15 R PDout 14 13 Optional Loop Error Signals (Note 1)
V+
3 REF fin Din ENB CLK
VSS 12 LD 11 fV 10 fR 9
MCU Optional
7
8D out
Threshold Detector Optional (Note 5)
Integrator (Note 4)
NOTES: 1. The R and V outputs are fed to an external combiner/loop filter. See the Phase-Locked Loop -- Low-Pass Filter Design page for additional information. The R and V outputs swing rail-to-rail. Therefore, the user should be careful not to exceed the common mode input range of the op amp used inthe combiner/loop filter. 2. For optimum performance, bypass the VDD pin to VSS (GND) with one or more low-inductance capacitors. 3. The R counter is programmed for a divide value = OSCin/fR. Typically, fR is the tuning resolution required for the VCO. Also, the VCO frequency divided by fR = N, wher e N is the divide value of the N counter. May be an R-C low-pass filter. May be a bipolar transistor.
4. 5.
Figure 24. Example Application
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 21
Design Considerations
V+
VDD A C OSCin OSCout MC145170-2 B D fin VSS No Connect
NOTE: The signals at Points A and B may be low-frequency sinusoidal or square waves with slow edge rates or noisy signal edges. At Points C and D, the signals are cleaned up, have sharp edge rates, and rail-to-rail signal swings. With signals as described at Points C and D, the MC145170-2 is guaranteed to operate down to a frequency as low as dc.
Figure 25. Low Frequency Operation Using DC Coupling
MC145170-2 Technical Data, Rev. 5 22 Freescale Semiconductor
Design Considerations
(Pin 4) f in SOG Package 1
2 3 4
Marker 1 2 3 4
Frequency (MHz) Resistance () Reactance () Capacitance (pF) 5 100 150 185 2390 39.2 25.8 42.6 -5900 -347 -237 -180 5.39 4.58 4.48 4.79
Figure 26. Input Impedance at fin - Series Format (R + jX) (5.0 MHz to 185 MHz)
Device #1 MC145170-2 Din CLK ENB Dout Din Device #2 MC145170-2 CLK ENB Dout
33 k NOTE 1 CMOS MCU Optional
NOTES: 1. The 33 k resistor is needed to prevent the Din pin from floating. (The Dout pin is a three-state output. 2. See related Figures 28, 29, and 30.
Figure 27. Cascading Two MC145170-2 Devices
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 23
24
7 8 15 9 24 10 16 25 26 31 17 23 18 32 33 34 39 40 NOTE X X X X C7 C6 C0 X X X C7 C6 C0 C Register Bits of Device #2 in Figure 27 C Register Bits of Device #1 in Figure 27
ENB
Design Considerations
CLK
1
2
Din
X
X
NOTE: At this point, the new data is transferred to the C registers of both devices and stored. No other registers are affected.
Figure 28. Accessing the C Registers of Two Cascaded MC145170-2 Devices
MC145170-2 Technical Data, Rev. 5
8 9 25 27 30 31 26 10 39 40 41 42 44 X X R14 R13 R9 R1 R0 X R14 R Register Bits of Device #2 in Figure 27
ENB NOTE 45 48 49 50 55 56
CLK
1
2
Din
X
X
R11
R7
R6
R0
R Register Bits of Device #1 in Figure 27
NOTE: At this point, the new data is transferred to the R registers of both devices and stored. No other registers are affected.
Freescale Semiconductor
Figure 29. Accessing the R Registers of Two Cascaded MC145170-2 Devices
ENB NOTE 8 15 39 41 47 40 16 17 23 32 24 33 25 31 9 10 48
Freescale Semiconductor
X X X N15 N8 N7 N0 N15 N8 N7 N0 N Register Bits of Device #2 in Figure 27 N Register Bits of Device #1 in Figure 27
CLK
1
2
Din
X
X
NOTE: At this point, the new data is transferred to the N registers of both devices and stored. No other registers are affected.
MC145170-2 Technical Data, Rev. 5
Figure 30. Accessing the N Registers of Two Cascaded MC145170-2 Devices
Design Considerations
25
Design Considerations
V+ VPD VDD Device #1 MC145170-2 Din CLK ENB Dout Din VDD VCC Device #2 Note 2 CLK ENB VPD Output A (Dout)
33 k Note 1 CMOS MCU Optional
NOTES: 1. The 33 k resistor is needed to prevent the Din pin from floating. (The Dout pin is a three-state output. 2. See related Figures 32, 33, and 34.
Figure 31. Cascading Two Different Device Types
MC145170-2 Technical Data, Rev. 5 26 Freescale Semiconductor
ENB NOTE 40
Freescale Semiconductor
7 16 17 18 23 24 25 26 31 32 33 34 39 8 9 15 10 X X X X C7 C6 C0 X X X C7 C6 C0 C Register Bits of Device #2 in Figure 31 C Register Bits of Device #1 in Figure 31
CLK
1
2
Din
X
X
NOTE: At this point, the new data is transferred to the C registers of both devices and stored. No other registers are affected.
Figure 32. Accessing the C Registers of Two Different Device Types
MC145170-2 Technical Data, Rev. 5
16 20 21 30 22 31 17 18 32 39 40 41 42 43 A23 A22 A19 A18 A9 A8 A0 X R14 R13 A Register Bits of Device #2 in Figure 31
ENB NOTE 46 47 48 55 56
CLK
1
2
Din
X
X
R9
R8
R0
R Register Bits of Device #1 in Figure 31
NOTE: At this point, the new data is transferred to the A register of Device #2 and R register of Device #1 and stored. No other registers are affected.
Figure 33. Accessing the A and R Registers of Two Different Device Types
Design Considerations
27
28
8 15 39 40 41 47 16 17 23 24 25 31 32 33 9 10 48 NOTE X X X R15 R8 R7 R0 N15 N8 N7 N0 R Register Bits of Device #2 in Figure 31 N Register Bits of Device #1 in Figure 31
ENB
Design Considerations
CLK
1
2
Din
X
X
NOTE: At this point, the new data is transferred to the R register of Device #2 and N register of Device #1 and stored. No other registers are affected.
MC145170-2 Technical Data, Rev. 5
Figure 34. Accessing the R and N Registers of Two Different Device Types
Freescale Semiconductor
Packaging
5
Packaging
-A16 9
B
1 8
NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: INCH. 3. DIMENSION L TO CENTER OF LEADS WHEN FORMED PARALLEL. 4. DIMENSION B DOES NOT INCLUDE MOLD FLASH. 5. ROUNDED CORNERS OPTIONAL.
INCHES MIN MAX 0.740 0.770 0.250 0.270 0.145 0.175 0.015 0.021 0.040 0.70 0.100 BSC 0.050 BSC 0.008 0.015 0.110 0.130 0.295 0.305 0 10 _ _ 0.020 0.040 MILLIMETERS MIN MAX 18.80 19.55 6.35 6.85 3.69 4.44 0.39 0.53 1.02 1.77 2.54 BSC 1.27 BSC 0.21 0.38 2.80 3.30 7.50 7.74 0 10 _ _ 0.51 1.01
F S
C
L
-TH G D
16 PL
SEATING PLANE
K
J
M
0.25 (0.010) M T A
M
DIM A B C D F G H J K L M S
Figure 35. Outline Dimensions for P Suffix, DIP-16 (Case 648-08, Issue R)
0.25
PIN'S NUMBER 1 8X
M
B A
6.2 5.8
16
1.75 1.35
0.25 0.10
16X
0.49 0.35 0.25
6
M
TAB
PIN 1 INDEX
14X
1.27
NOTES: 1. DIMENSIONS ARE IN MILLIMETERS. 2. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 3. DATUMS A AND B TO BE DETERMINED AT THE PLANE WHERE THE BOTTOM OF THE LEADS EXIT THE PLASTIC BODY. 4. THIS DIMENSION DOES NOT INCLUDE MOLD FLASH, PROTRUSION OR GATE BURRS, MOLD FLASH, PROTRUSIONS OR GATE BURRS SHALL NOT EXCEED 0.15 MM PER SIDE. THIS DIMENSION IS DETERMINED AT THE PLANE WHERE THE BOTTOM OF THE LEADS EXIT THE PLASTIC BODY. 5. THIS DIMENSION DOES NOT INCLUDE INTER-LEAD FLASH OR PROTRUSIONS. INTER-LEAD FLASH AND PROTRUSIONS SHALL NOT EXCEED 0.25 MM PER SIDE. THIS DIMENSION IS DETERMINED AT THE PLANE WHERE THE BOTTOM OF THE LEADS EXIT THE PLASTIC BODY. 6. THIS DIMENSION DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD WIDTH TO EXCEED 0.62 MM.
4 A A
10.0 9.8
8
9
T 4.0 3.8 5 0.50 0.25 B
16X
SEATING PLANE
0.1 T
X45
0.25 0.19
1.25 0.40 SECTION A-A
7 0
Figure 36. Outline Dimensions for D Suffix, SOG-16 (Case 751B-05, Issue K)
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 29
Packaging
A -P-
16x
K
REF M
0.200 (0.008)
T
16
9
L
PIN 1 IDENTIFICATION
1 8
B
NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSIONS A AND B ARE TO BE DETERMINED AT DATUM PLANE -U-.
DIM A B C D F G H J J1 K K1 L M MILLIMETERS MIN MAX --5.10 4.30 4.50 --1.20 0.05 0.25 0.45 0.55 0.65 BSC 0.22 0.23 0.09 0.24 0.09 0.18 0.16 0.32 0.16 0.26 6.30 6.50 0 5 10 5 INCHES MIN MAX --- 0.200 0.169 0.177 --0047 0.002 0.010 0.018 0.022 0.026 BSC 0.009 0.010 0.004 0.009 0.004 0.007 0.006 0.013 0.006 0.010 0.248 0.256 0 5 10 5
C 0.100 (0.004)
M
-U-
-T-
SEATING PLANE
D
G
H
K J1 J K1
A M
A
SECTION A-A
F
Figure 37. Outline Dimensions for DT Suffix, TSSOP-16 (Case 948C-03, Issue B)
MC145170-2 Technical Data, Rev. 5 30 Freescale Semiconductor
NOTES
MC145170-2 Technical Data, Rev. 5 Freescale Semiconductor 31
How to Reach Us:
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MC145170-2/D Rev. 5 1/2005


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